Hitachi FlexSEM 1000 II

Electron microscopy Electron microscopes SEM / FIB-SEM

The Hitachi FlexSEM 1000 II scanning electron microscope combines a compact design with high performance in the W-SEM class of tungsten microscopes. State-of-the-art technology enables the use of standard options such as elemental EDS analysis, work under reduced vacuum called VP mode, 3D sample surface measurement, STEM, in-situ experiments, use of a cooled stage and more. FlexSEM will change the way you look at electron microscopy!

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