Hitachi SU9000

Hitachi

Ultra high-resolution scanning electron microscope FE-SEM/STEM. Cold cathode Cold FEG is ideal for high resolution imaging with small source size and narrow energy spectrum. The innovative CFE Gun technology contributes to a perfect FE-SEM with excellent brightness and beam stability, enabling high resolution imaging and high quality feature analysis. The unique “true in-lens” design of the objective lens enables EELS as well as diffraction to be performed.

 

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M. Bacik
M. Bacik
product specialist
+420 123 456 789
bacik@specion.cz
"Do not hesitate to contact me, I will be happy to help you with application, technical and business questions."
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