Leica EM TIC 3X

The Leica EM TIC 3X Ion Polisher is used to achieve high quality cuts on hard materials without deforming the surface of the observed area. The triple ion cannon system is designed to prepare hard, porous, heat-sensitive, brittle or heterogeneous materials for SEM, AFM and microstructural analysis (EDS, WDS, Auger, EBSD). The unique triple ion cannon system allows you to reduce sample preparation time and reach deeper into the sample. The instrument can be configured with a large number of sample holders to meet the exact requirements of the application. The system also allows for contrasting and the use of a chilled stage.