Leica EM TXP
Leica EM TXP is used for mechanical sample preparation of SEM, TEM or even LM samples. It allows milling, cutting, grinding and polishing of the sample in one instrument, without the need to move it. The integrated stereomicroscope allows identification and easy handling of even small samples. The sample holder can be easily tilted for better control of the surface to be machined.
The instrument also allows the use of automatic processes. Milling, cutting, grinding, polishing and observation of the sample through the stereomicroscope can be performed.
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We offer service activities on devices. We perform installation, training, reconstruction and maintenance for the entire period of use.