CAMECA LEAP 6000

CAMECA

APT with maximum resolution for the smallest sample volume in microtip form for the most demanding scientific applications.

  • Capable of operating in pulsed laser source mode, or in voltage pulse mode, or both pulses simultaneously for 1 sample
  • Automation for long-term unattended experiments
  • Options: vacuum and cryogenic module for sample input and analysis, plasma cleaner and residual gas analyzer, FIM microscope (Field Ion M)
  • Sample preparation: FIB system

 

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A. Gába
A. Gába
product specialist
+420 244 402 091
gaba@specion.cz
"I have been in the materials technology, surface studies and testing industry for several decades and would be happy to consult with you on your application needs and we will be sure to find a solution with our top instrument suppliers."
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Do you need warranty or post-warranty service?

We offer service activities on devices. We perform installation, training, reconstruction and maintenance for the entire period of use.

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+420 244 402 091
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