ION-TOF Qtac
The extremely sensitive Low Energy Ion Scattering (LEIS) surface analysis instrument analyzes the primary atomic layer both quantitatively and quantitatively, suitable for samples in catalysis, semiconductors, metals, polymers and fuel cells. It also works with small area analysis, surface imaging and in static or dynamic depth profiling.
- Quantitative elemental analysis of the top atomic layer
- TOF filtering in depth profiling
- Analysis of electrically non-conductive and rough surface samples
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Specion service
Do you need warranty or post-warranty service?
We offer service activities on devices. We perform installation, training, reconstruction and maintenance for the entire period of use.
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+420 244 402 091
Call only MON - FR 9 - 17h.