HORIBA MESA-50

The X-ray Fluorescence Analyzer (XGT) provides screening measurements of samples containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV and Cl for halogen-free applications. The system is user-friendly in operation and includes three analytical diameters that are suitable for any sample, from thin cables and electronic components to bulky samples.

Benefits:

• Silicon Drift Detector (SDD) dramatically reduces measurement time and provides increased sensitivity for true high-throughput analysis
• portability, small size and light weight including internal battery power
• reduced routine maintenance (operation without LN2), use of vacuum pump
• no concern for X-ray leakage