HORIBA XploRa Plus

Spectroscopy Raman spectrometers and AFM (TERS) Benchtop Raman spectrometers

The XploRA PLUS is our reliable and powerful Raman microscope that is ideal for research and analytical laboratories. It is fully confocal, which does not compromise image quality, spatial or depth resolution. SWIFT Fast Raman technology enables fast confocal mapping, typically 10x faster than conventional Raman scanning.
The simplicity and performance of the XploRA PLUS system are unmatched with an expanded range of options such as multiple laser wavelengths, EMCCD detection, Raman spectrum polarization, or even Raman-AFM combinations for TERS analysis.

Benefits:

basic laser wavelengths: 532, 638, 785 nm plus more on request
confocal mapping with 0.5 μm XY resolution
SWIFT technology for up to 10x faster mapping

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