Our references
SPECION, s.r.o. is a supplier of instruments for the most advanced research applications in the field of material and biological sciences, as well as technologies and test equipment for future fields such as pharmaceutics, e-mobility, energy saving, semiconductor industry, etc.
Instrument: Henniker Plasma HPT-200
Low vacuum plasma system for modification of material surfaces. A pair of MFC valves allows precise adjustment of the process gas ratio.
Instrument: Hitachi FlexSem 1000
A new compact W-SEM including EDS for a wide range of applications required in a university environment, complete with sample preparation for biological materials from Leica Microsystems and image correlation capability with a Raman system from Horiba Scientific.
Instrument: Leica THUNDER Imager EM Cryo CLEM
Cryogenic light microscope for observation of frozen 3mm meshes and sapphires for correlation and focusing of the site of interest in the fluorescence signal and subsequent transfer to cryo EM.
Instrument: Hitachi HT7800
Modern 120 kV TEM with digital overview and main camera. Configured for both routine clinical diagnostics, especially viruses, and including a cryogenic sample holder for frozen slides and EDS. Complete with Leica Microsystems sample preparation and light microscope also by Leica Microsystems for correlative microscopy (CLEM).
Instrument: Leica EM ACE900
Specialized equipment for the preparation of biological slides for cryogenic electron microscopy and related advanced sample preparation methods. The laboratory is fully equipped with state-of-the-art sample preparation methods from Leica Microsystem, such as high-pressure freezing, freezing of meshes in liquid ethane, cryo CLEM and others.
Instrument: Kratos Supra
AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unmatched automation and ease of use for surface characterization of materials. The patented AXIS technology provides high electron collection efficiency in spectroscopy mode and low aberrations at high magnification in parallel imaging mode.
Instrument: Leica EM TIC3X
A light-ion beam polishing instrument for scanning electron microscopy samples, enabling the creation of precise cross-sections through brittle, heterogeneous, porous and temperature-sensitive materials for their study by scanning electron microscopy and analytical methods EBSD, EDS and WDS. Furthermore, the instrument enables ion polishing of large areas under oblique ion beam incidence for the study of the above materials by the above mentioned methods.
Instrument: HORIBA Duetta
New 3-in-1 fluorescence spectrometer - combining a fluorescence and absorption spectrometer with a fast CCD detector in one system
